Features

• Non-destructive X-ray fluorescence analysis for rapid elemental identification and quantification
• Supports analysis of more than 60 elements from potassium (K) to uranium (U)
• Si PIN semiconductor detector provides elemental X-ray detection
• Single sample chamber simplifies sample placement and measurement
• Integrated X-ray tube, amplifier circuit, and high- and low-voltage power supplies
• Non-Vacuum chamber supports the X-ray measurement system
• Element concentrations are determined through calibrated X-ray fluorescence intensity
• Designed for precious-metal analysis, including platinum, palladium, rhodium, gold, iridium, and other alloying elements